CWEweakness

CWE-1248 Semiconductor Defects in Hardware Logic with Security-Sensitive Implications

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Abstraction
Base
Structure
Simple
Status
Incomplete
Languages
Not Language-Specific
CWE version
5.0

Description

The security-sensitive hardware module contains semiconductor defects.

Common consequences

• Availability, Access Control: DoS: Instability — Semiconductor defects manifest as faults on chip-internal signals or registers, have the effect of inputs, outputs, or intermediate signals being always 0 or always 1, and do not switch as expected. If such faults occur in security-sensitive hardware modules, the security objectives of the hardware module may be compromised.

Potential mitigations

• [Testing] While semiconductor-manufacturing companies implement several mechanisms to continuously improve the semiconductor manufacturing process to ensure reduction of defects, some defects can only be fixed after manufacturing. Post-manufacturing testing of silicon die is critical. Fault models such as stuck-at-0 or stuck-at-1 must be used to develop post-manufacturing test cases and achieve good coverage. Once the silicon packaging is done, extensive post-silicon testing must be performed to ensure that hardware logic implementing security functionalities is defect-free. • [Operation] Operating the hardware outside device specification, such as at extremely high temperatures, voltage, etc., accelerates semiconductor degradation and results in defects. When these defects manifest as faults in security-critical, hardware modules, it results in compromise of security guarantees. Thus, operating the device within the specification is important.

Related

Attack pattern · CAPEC (2)

  • CAPEC-624 Hardware Fault Injection attack pattern
  • CAPEC-625 Mobile Device Fault Injection attack pattern

Child of · CWE (1)

  • CWE-693 Protection Mechanism Failure weakness

Referenced by CAPEC · weakness (2)

  • CAPEC-624 Hardware Fault Injection attack pattern
  • CAPEC-625 Mobile Device Fault Injection attack pattern