CWE-1297 Unprotected Confidential Information on Device is Accessible by OSAT Vendors

The product does not adequately protect confidential information on the device from being accessed by Outsourced Semiconductor Assembly and Test (OSAT) vendors.

To counter this, the chipmaker often requires the OSAT partner to enter into restrictive non-disclosure agreements (NDAs). Nonetheless, OSAT vendors likely have many customers, which increases the risk of accidental sharing of information. There may also be a security vulnerability in the information technology (IT) system of the OSAT facility. Alternatively, a malicious insider at the OSAT facility may carry out an insider attack. Logic errors during design or synthesis could misconfigure the interconnection of the debug components, which could provide improper authorization to sensitive information.

• Confidentiality, Integrity, Access Control, Authentication, Authorization, Availability, Accountability, Non-Repudiation: Gain Privileges or Assume Identity, Bypass Protection Mechanism, Execute Unauthorized Code or Commands, Modify Memory, Modify Files or Directories — The impact depends on the confidential information itself and who is inadvertently granted access. For example, if the confidential information is a key that can unlock all the parts of a generation, the impact could be severe.

• [Architecture and Design] It behooves the chipmaker to minimize any confidential information in the device that may be accessible to the OSAT vendor. a • Ensure that when an OSAT vendor is allowed to access test interfaces necessary for preproduction and returned parts, the vendor only pulls the minimal information necessary. Also, architect the product in such a way that, when an "unlock device" request comes, it only unlocks that specific part and not all the parts for that product line. • Ensure that the product's non-volatile memory (NVM) is scrubbed of all confidential information and secrets before handing it over to an OSAT. • Arrange to secure all communication between an OSAT facility and the chipmaker.

• Architecture or Design Review: Appropriate Post-Si tests should be carried out to ensure that residual confidential information is not left on parts leaving one facility for another facility. • Dynamic Analysis with Manual Results Interpretation: Appropriate Post-Si tests should be carried out to ensure that residual confidential information is not left on parts leaving one facility for another facility.