MITRE D3FENDdefensive technique
D3-RH Radiation Hardening
- Tactic
- Harden
Definition
Radiation hardening is the process of making electronic components and circuits resistant to damage or malfunction caused by high levels of ionizing radiation.
How it works
How it works
There are three core radiation hardening methodologies:
1. Radiation Hardening by Process (RHBP): modifying the physical fabrication of a semiconductor (e.g., using SOI - Silicon on Insulator), offering the highest intrinsic protection. Usually the most expensive option as it requires a specialized semiconductor fabrication plant.
2. Radiation Hardening by Design (RHBD): modifying circuit topology and physical layout using techniques such as Triple Modular Redundancy (TMR). A more cost-effective option, with the constraint of potentially increasing chip area and power.
3. Radiation Hardening by Shielding (RHBS): using physical materials (e.g., aluminum or tantalum) to block ionizing particles. Simple to implement, with the constraint of increasing size and weight.
Related
Counters · MITRE ATT&CK (16)
- T1619 Cloud Storage Object Discovery technique
- T0847 Replication Through Removable Media technique
- T0860 Wireless Compromise technique
- T1052.001 Exfiltration over USB sub-technique
- T1195.003 Compromise Hardware Supply Chain sub-technique
- T1056.001 Keylogging sub-technique
- T1195 Supply Chain Compromise technique
- T1200 Hardware Additions technique
- T1025 Data from Removable Media technique
- T1052 Exfiltration Over Physical Medium technique
- T1056 Input Capture technique
- T1091 Replication Through Removable Media technique
- T1092 Communication Through Removable Media technique
- T1111 Multi-Factor Authentication Interception technique
- T1123 Audio Capture technique
- T1125 Video Capture technique
Child of · MITRE D3FEND (1)
- D3-PH Platform Hardening defensive technique
Referenced by MITRE D3FEND · child of (1)
- D3-EMH Electromagnetic Radiation Hardening defensive technique
References
- https://www.mdpi.com/1424-8220/20/1/171 A Radiation-Hardened SAR ADC with Delay-Based Dual Feedback Flip-Flops for Sensor Readout Systems
- https://www.mdpi.com/2079-9292/10/17/2144 Diagnosis of Faults Induced by Radiation and Circuit-Level Design Mitigation Techniques: Experience from VCO and High-Speed Driver CMOS ICs Case Studies
- https://patents.google.com/patent/US20110296412A1 A Method of making thin atomic (Z) grade shields